Yield predictive model characterization in analog circuit design

S. H. M. Ali; P. R. Wilson; A. D. Brown

doi:10.1109/ISICIR.2007.4441855

Yield predictive model characterization in analog circuit design

S. H. M. Ali, P. R. Wilson, A. D. Brown

Department of Electronic & Electrical Engineering

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Original language	English
Title of host publication	International Symposium on Integrated Circuits (ISIC) , 2007
Publisher	IEEE
Pages	289-292
ISBN (Print)	9781424407965
DOIs	https://doi.org/10.1109/ISICIR.2007.4441855
Publication status	Published - 1 Sept 2007
Event	2007 International Symposium on Integrated Circuits (ISIC) - , Singapore Duration: 26 Sept 2007 → 28 Sept 2007

Conference

Conference	2007 International Symposium on Integrated Circuits (ISIC)
Country/Territory	Singapore
Period	26/09/07 → 28/09/07

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10.1109/ISICIR.2007.4441855

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@inproceedings{2f1a2319c2a34d4e999fd9374362e554,

title = "Yield predictive model characterization in analog circuit design",

author = "Ali, {S. H. M.} and Wilson, {P. R.} and Brown, {A. D.}",

year = "2007",

month = sep,

day = "1",

doi = "10.1109/ISICIR.2007.4441855",

language = "English",

isbn = "9781424407965",

pages = "289--292",

booktitle = "International Symposium on Integrated Circuits (ISIC) , 2007",

publisher = "IEEE",

address = "USA United States",

note = "2007 International Symposium on Integrated Circuits (ISIC) ; Conference date: 26-09-2007 Through 28-09-2007",

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TY - GEN

T1 - Yield predictive model characterization in analog circuit design

AU - Ali, S. H. M.

AU - Wilson, P. R.

AU - Brown, A. D.

PY - 2007/9/1

Y1 - 2007/9/1

UR - http://dx.doi.org/10.1109/ISICIR.2007.4441855

U2 - 10.1109/ISICIR.2007.4441855

DO - 10.1109/ISICIR.2007.4441855

M3 - Chapter in a published conference proceeding

SN - 9781424407965

SP - 289

EP - 292

BT - International Symposium on Integrated Circuits (ISIC) , 2007

PB - IEEE

T2 - 2007 International Symposium on Integrated Circuits (ISIC)

Y2 - 26 September 2007 through 28 September 2007

ER -

Yield predictive model characterization in analog circuit design

Conference

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