Yield predictive model characterization in analog circuit design

S. H. M. Ali, P. R. Wilson, A. D. Brown

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Symposium on Integrated Circuits (ISIC) , 2007
PublisherIEEE
Pages289-292
ISBN (Print)9781424407965
DOIs
Publication statusPublished - 1 Sep 2007
Event2007 International Symposium on Integrated Circuits (ISIC) - , Singapore
Duration: 26 Sep 200728 Sep 2007

Conference

Conference2007 International Symposium on Integrated Circuits (ISIC)
CountrySingapore
Period26/09/0728/09/07

Cite this

Ali, S. H. M., Wilson, P. R., & Brown, A. D. (2007). Yield predictive model characterization in analog circuit design. In International Symposium on Integrated Circuits (ISIC) , 2007 (pp. 289-292). IEEE. https://doi.org/10.1109/ISICIR.2007.4441855