Yield improvement using configurable analogue transistors (CATs)

P. R. Wilson, R. Wilcock

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Continued process scaling has led to significant yield and reliability challenges for today?s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. This paper describes a new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit
Original languageEnglish
Pages (from-to)1132-1134
Number of pages3
JournalElectronics Letters
Volume44
Issue number19
DOIs
Publication statusPublished - 2008

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