Waveguide artefacts in terahertz near field imaging

M. Misra, Steven R Andrews, S. A. Maier

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Abstract

We report experimental and computational studies of the behaviour of a photoconductive THz near field probe when imaging a simple planar metal-dielectric structure. We show that the excitation of waveguide modes in the gap between sample and probe, together with diffraction at the probe, must generally be taken into account when analysing images and that electromagnetic simulations provide a very useful aid to interpretation.
Original languageEnglish
Article number191109
Number of pages3
JournalApplied Physics Letters
Volume100
Issue number19
DOIs
Publication statusPublished - 7 May 2012

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