Volumetric soft field and hard field tomography: MIT, ECT, EIT, Cone beam CT

Z. Ye, C. L. Yang, L. Ma, H. Y. Wei, R. Banasiak, M. Soleimani

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

1 Citation (SciVal)


In this paper volumetric imaging results will be presented for soft field tomography techniques such as electrical impedance tomography (EIT), electrical capacitance tomography (ECT) and magnetic induction tomography (MIT). Volumetric imaging results are also shown in hard field tomography in cone beam X-ray CT. The forward problem in soft field electromagnetic tomography is governed by various approximations of the Maxwell’s questions; the Jacobian matrix is then established to solve the inverse problem. The forward model in cone beam CT is based on intersection of straight lines between source and detectors and 3D voxels. A parallel conjugate gradient method is used to solve each of the inverse algorithms in all above imaging system.

Original languageEnglish
Title of host publication7th World Congress in Industrial Process Tomography
PublisherInternational Society for Industrial Process Tomography
Number of pages5
ISBN (Electronic)9780853163237
Publication statusPublished - 1 Jan 2014
Event7th World Congress in Industrial Process Tomography (WCIPT7) - Krakow, Poland
Duration: 2 Sept 20135 Sept 2013


Conference7th World Congress in Industrial Process Tomography (WCIPT7)


  • Cone beam X-ray CT
  • Electrical capacitance tomography
  • Electrical impedance tomography
  • Magnetic induction tomography

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Control and Systems Engineering
  • Computational Mechanics


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