Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks

P G Coleman, C P Burrows, R Mahapatra, N G Wright

Research output: Contribution to journalArticle

5 Citations (Scopus)
Original languageEnglish
JournalJournal of Applied Physics
Volume102
Issue number1
Publication statusPublished - 2007

Cite this

Coleman, P. G., Burrows, C. P., Mahapatra, R., & Wright, N. G. (2007). Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks. Journal of Applied Physics, 102(1).