Original language | English |
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Journal | Journal of Applied Physics |
Volume | 102 |
Issue number | 1 |
Publication status | Published - 2007 |
Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks
P G Coleman, C P Burrows, R Mahapatra, N G Wright
Research output: Contribution to journal › Article › peer-review
5
Citations
(SciVal)