Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks

P G Coleman, C P Burrows, R Mahapatra, N G Wright

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)
Original languageEnglish
JournalJournal of Applied Physics
Volume102
Issue number1
Publication statusPublished - 2007

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