Time resolved EBIC study of InAlN/GaN HFETs

A. Šatka, J. Priesol, M. Bernát, D. Donoval, J. Kováč, D. W E Allsopp, J. Kuzmík

Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

Fingerprint

Dive into the research topics of 'Time resolved EBIC study of InAlN/GaN HFETs'. Together they form a unique fingerprint.

Engineering

Material Science