Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Wei Ding, Andriy V Gorbach, William J Wadsworth, Jonathan C Knight, Dmitry Skryabin, M J Strain, M Sorel, R M De la Rue

Research output: Contribution to journalArticle

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Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.
LanguageEnglish
Pages26625-26630
Number of pages6
JournalOptics Express
Volume18
Issue number25
DOIs
StatusPublished - 2010

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cross correlation
solitary waves
waveguides
silicon
group velocity
pulses
nonlinearity
insulators
wavelengths

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Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. / Ding, Wei; Gorbach, Andriy V; Wadsworth, William J; Knight, Jonathan C; Skryabin, Dmitry; Strain, M J; Sorel, M; De la Rue, R M.

In: Optics Express, Vol. 18, No. 25, 2010, p. 26625-26630.

Research output: Contribution to journalArticle

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AU - Skryabin,Dmitry

AU - Strain,M J

AU - Sorel,M

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