Thickness-dependent microstructural properties of heteroepitaxial (00.1) CuFeO2 thin films on (00.1) sapphire by pulsed laser deposition
- Sijun Luo
- , Aline Fluri
- , Song Zhang
- , Xue Liu
- , Max Döbeli
- , George F. Harrington
- , Rong Tu
- , Daniele Pergolesi
- , Tasumi Ishihara
- , Thomas Lippert
- Kyushu University
- Paul Scherrer Institute
- Wuhan University of Technology
- Nanyang Technological University
- ETH Zürich
- Molecular Photoconversion Devices Division
- Center of Coevolutionary Research for Sustainable Communities (C2RSC)
Research output: Contribution to journal › Article › peer-review
16
Link opens in a new tab
Citations
(SciVal)