Thermal wave measurement of wet paint film thickness

J P Sargent, Darryl P Almond, N Gathercole

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Thermal wave phase measurements are reported on the drying of wet paint films on aluminium substrates. Measurements of the change in thickness as the paint dries have also been obtained using a differential focussing technique on an optical microscope. By including the optical microscope measurements of the drying paint film thickness together with estimates for the density and thermal properties of the drying and cured paint, predictions have been made of the thermal phase/thickness relationships for the wet, dry, curing and cured paints. It is concluded that a phase measurement on the wet paints could be used to predict a final cured paint thickness with an accuracy of approximately ±2 μm. Errors in predicting cured film thickness from a wet film thermal phase measurement arises principally from uncertainty over the solvent content of the wet paint film, the state of cure, and the consequent uncertainty over the paint density and thermal properties.
Original languageEnglish
Pages (from-to)333-339
Number of pages7
JournalJournal of Materials Science
Volume41
Issue number2
DOIs
Publication statusPublished - Jan 2006

Fingerprint Dive into the research topics of 'Thermal wave measurement of wet paint film thickness'. Together they form a unique fingerprint.

  • Cite this