The impact of trench defects in InGaN/GaN light emitting diodes and implications for the "green gap" problem

F.C.-P. Massabuau, M.J. Davies, F. Oehler, S.K. Pamenter, E.J. Thrush, M.J. Kappers, A. Kovács, T. Williams, M.A. Hopkins, C.J. Humphreys, P. Dawson, R.E. Dunin-Borkowski, J. Etheridge, D.W.E. Allsopp, R.A. Oliver

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