Abstract
It has been shown that the universal dielectric response (UDR) of heterogeneous materials can be reproduced by electrical networks consisting of randomly positioned resistor and capacitors. The random network represents a microstructure that contains both insulating (the capacitor) and conductive regions (the resistor). This paper presents an investigation into the frequency dependent properties of large numbers of resistor-capacitor (R-C) networks. Parameters investigated include permittivity, conductivity and phase angle, with particular emphasis on observed power-law behavior and a comparison with previous work in this area.
Original language | English |
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Pages (from-to) | 199-208 |
Number of pages | 10 |
Journal | Ferroelectrics |
Volume | 319 |
DOIs | |
Publication status | Published - 2005 |
Keywords
- Dielectric properties
- Mathematical models
- Random processes
- Parameter estimation
- Circuit theory
- Electric conductivity
- Permittivity