The framework of the virtual laser tracker: a systematic approach to the assessment of error sources and uncertainty in laser tracker measurement

Dehong H Huo, Paul G Maropoulos, Chun Hung Cheng

Research output: Chapter or section in a book/report/conference proceedingChapter or section

20 Citations (SciVal)

Abstract

Laser trackers have been widely used in many industries to meet increasingly high accuracy requirements. In laser tracker measurement, it is complex and difficult to perform an accurate error analysis and uncertainty evaluation. This paper firstly reviews the working principle of single beam laser trackers and state-of-the-art of key technologies from both industrial and academic efforts, followed by a comprehensive analysis of uncertainty sources. A generic laser tracker modelling method is formulated and the framework of the virtual tracker is proposed. The VLS can be used for measurement planning, measurement accuracy optimization and uncertainty evaluation. The completed virtual laser tracking system should take all the uncertainty sources affecting coordinate measurement into consideration and establish an uncertainty model which will behave in an identical way to the real system.
Original languageEnglish
Title of host publicationProceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
EditorsG Q Huang, K L Mak, P G Maropoulos
Place of PublicationBerlin, Heidelberg
PublisherSpringer
Pages507-523
Number of pages17
Volume66
ISBN (Electronic)978-3-642-10430-5
ISBN (Print)9783642104299
DOIs
Publication statusPublished - 2010
Event6th International Conference on Digital Enterprise Technology (DET 2009) - Hong Kong, Hong Kong
Duration: 14 Dec 200916 Dec 2009

Publication series

NameAdvances in Intelligent and Soft Computing
PublisherSpringer Verlag

Conference

Conference6th International Conference on Digital Enterprise Technology (DET 2009)
Abbreviated titleDET2009
Country/TerritoryHong Kong
CityHong Kong
Period14/12/0916/12/09

Keywords

  • measurement uncertainty
  • error modeling
  • virtual laser tracker
  • simulation
  • large scale metrology

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