Abstract
Highly localised carbon doping is demonstrated within the active region of strained InGaAs/GaAs MQW lasers. As predicted by numerical beam propagation simulations, the smaller linewidth enhancement factor arising from the combination of strain and p-doping leads to reduced filamentation in tapered laser structures, as compared to devices fabricated from otherwise identical epilayer structures containing undoped active regions.
| Original language | English |
|---|---|
| Pages (from-to) | 651-653 |
| Number of pages | 3 |
| Journal | Electronics Letters |
| Volume | 31 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 13 Apr 1995 |
Keywords
- Modulation doping
- Semiconductor doping
- Semiconductor junction lasers
ASJC Scopus subject areas
- Electrical and Electronic Engineering