Abstract
Highly localised carbon doping is demonstrated within the active region of strained InGaAs/GaAs MQW lasers. As predicted by numerical beam propagation simulations, the smaller linewidth enhancement factor arising from the combination of strain and p-doping leads to reduced filamentation in tapered laser structures, as compared to devices fabricated from otherwise identical epilayer structures containing undoped active regions.
Original language | English |
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Pages (from-to) | 651-653 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 31 |
Issue number | 8 |
DOIs | |
Publication status | Published - 13 Apr 1995 |
Keywords
- Modulation doping
- Semiconductor doping
- Semiconductor junction lasers
ASJC Scopus subject areas
- Electrical and Electronic Engineering