Abstract
In this work, a new dual-frequency imaging framework of capacitively coupled electrical impedance tomography (CCEIT) is presented. Unlike conventional single-frequency imaging and recently emerged multifrequency imaging, the dual-frequency imaging adopts two different working frequencies to obtain the real part and the imaginary part of the impedance, respectively. With the real part image and the imaginary part image reconstructed at the two frequencies, the framework further introduces image fusion to obtain the fused image. To achieve the optimal selection of the two frequencies, data collection in a wide frequency range is carried out with a 12-electrode CCEIT sensor, an impedance analyzer, and a computer to obtain the real part and the imaginary part measurements. The multifrequency data are then analyzed in depth, and other two aspects, including the sensitivity distribution and the imaging quality at different frequencies, are also investigated. Research results show that a low working frequency is recommended for the real part, while a relatively high working frequency is recommended for the imaginary part. Within the investigated frequency range of 200 kHz-20 MHz, the working frequencies for the real part and the imaginary part are optimized under the investigated distribution setups. Results of verification experiment show that the proposed framework is effective. Compared with single-frequency CCEIT, dual-frequency CCEIT with the two optimized frequencies has much better imaging performance.
Original language | English |
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Article number | 9812719 |
Pages (from-to) | 1-1 |
Number of pages | 1 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 71 |
Early online date | 1 Jul 2022 |
DOIs | |
Publication status | Published - 31 Dec 2022 |
Bibliographical note
This work was supported in part by the National Natural Science Foundation of China under Grant 51976189Keywords
- Electrical impedance tomography
- Electrical impedance tomography (EIT)
- Electrodes
- Frequency measurement
- Imaging
- Impedance
- Impedance measurement
- Tomography
- capacitively coupled electrical impedance tomography (CCEIT)
- dual-frequency imaging
- multi-frequency measurement acquisition
- working frequency
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering