Structural studies on surfactant-templated silica films growtn at the air/water interface

Karen J. Edler, Arach Goldar, Arwel V. Hughes, Steve J. Roser, Stephen Mann

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.

Original languageEnglish
Pages (from-to)661-670
Number of pages10
JournalMicroporous and Mesoporous Materials
Volume44-45
DOIs
Publication statusPublished - 6 Apr 2001

Fingerprint

Surface measurement
Film growth
Pressure measurement
X ray scattering
Surface-Active Agents
Silicon Dioxide
Microscopic examination
Surface active agents
surfactants
Silica
silicon dioxide
X rays
Brewster angle
Water
air
pressure measurement
Air
water
induction
x rays

Keywords

  • Films mesostructure
  • Formation mechanism
  • Reflectivity

ASJC Scopus subject areas

  • Catalysis
  • Materials Science(all)

Cite this

Structural studies on surfactant-templated silica films growtn at the air/water interface. / Edler, Karen J.; Goldar, Arach; Hughes, Arwel V.; Roser, Steve J.; Mann, Stephen.

In: Microporous and Mesoporous Materials, Vol. 44-45, 06.04.2001, p. 661-670.

Research output: Contribution to journalArticle

Edler, Karen J. ; Goldar, Arach ; Hughes, Arwel V. ; Roser, Steve J. ; Mann, Stephen. / Structural studies on surfactant-templated silica films growtn at the air/water interface. In: Microporous and Mesoporous Materials. 2001 ; Vol. 44-45. pp. 661-670.
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