Structural studies on surfactant-templated silica films growtn at the air/water interface

Karen J. Edler; Arach Goldar; Arwel V. Hughes; Steve J. Roser; Stephen Mann

doi:10.1016/S1387-1811(01)00247-5

Structural studies on surfactant-templated silica films growtn at the air/water interface

Karen J. Edler, Arach Goldar, Arwel V. Hughes, Steve J. Roser, Stephen Mann

Research output: Contribution to journal › Article › peer-review

4 Citations (SciVal)

Abstract

In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.

Original language	English
Pages (from-to)	661-670
Number of pages	10
Journal	Microporous and Mesoporous Materials
Volume	44-45
DOIs	https://doi.org/10.1016/S1387-1811(01)00247-5
Publication status	Published - 6 Apr 2001

Keywords

Films mesostructure
Formation mechanism
Reflectivity

ASJC Scopus subject areas

Catalysis
Materials Science(all)

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10.1016/S1387-1811(01)00247-5

Cite this

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abstract = "In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.",

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author = "Edler, {Karen J.} and Arach Goldar and Hughes, {Arwel V.} and Roser, {Steve J.} and Stephen Mann",

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AU - Edler, Karen J.

AU - Goldar, Arach

AU - Hughes, Arwel V.

AU - Roser, Steve J.

AU - Mann, Stephen

PY - 2001/4/6

Y1 - 2001/4/6

N2 - In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.

AB - In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.

KW - Films mesostructure

KW - Formation mechanism

KW - Reflectivity

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U2 - 10.1016/S1387-1811(01)00247-5

DO - 10.1016/S1387-1811(01)00247-5

M3 - Article

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VL - 44-45

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JO - Microporous and Mesoporous Materials

JF - Microporous and Mesoporous Materials

SN - 1387-1811

ER -

Structural studies on surfactant-templated silica films growtn at the air/water interface

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

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