Abstract
In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period.
| Original language | English |
|---|---|
| Pages (from-to) | 661-670 |
| Number of pages | 10 |
| Journal | Microporous and Mesoporous Materials |
| Volume | 44-45 |
| DOIs | |
| Publication status | Published - 6 Apr 2001 |
Funding
The beamline scientist on Troika II at the ESRF Dr. Oleg Konovalov is gratefully acknowledged for his assistance in the X-ray experiments. Dr. Roberto Felici is also to be thanked for his assistance with the ESRF experiments. The financial support of the EPSRC Materials Committee (grant no. GR/M15989) is also acknowledged.
Keywords
- Films mesostructure
- Formation mechanism
- Reflectivity
ASJC Scopus subject areas
- Catalysis
- General Materials Science