Structural studies on surfactant-templated silica films grown at the air/water interface

K J Edler, A Goldar, A V Hughes, S J Roser, S Mann

Research output: Contribution to journalArticle

Abstract

In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period. (C) 2001 Elsevier Science B.V. All rights reserved.
Original languageEnglish
Pages (from-to)661-670
Number of pages10
JournalMicroporous and Mesoporous Materials
Volume44
Publication statusPublished - 2001

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