In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period. (C) 2001 Elsevier Science B.V. All rights reserved.
|Number of pages||10|
|Journal||Microporous and Mesoporous Materials|
|Publication status||Published - 2001|