Structural and phase changes in amorphous solid water films revealed by positron beam spectroscopy

Y C Wu, Alexis Kallis, J Jiang, Paul G Coleman

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Abstract

The evolution and annealing of pores in, and the crystallization of, vapor-deposited films of amorphous solid water have been studied by using variable-energy positron annihilation spectroscopy for temperatures in the range 50–150 K. Both positron and positronium annihilation provide insight to the nature of the grown-in pores and their evolution with temperature. Crystallization of the films was observed at just below 140 K, in agreement with earlier studies, with the topmost 80 nm undergoing a transition consistent with crystallization at 90–100 K.
Original languageEnglish
Article number066103
Number of pages4
JournalPhysical Review Letters
Volume105
Issue number6
Early online date4 Aug 2010
DOIs
Publication statusPublished - 6 Aug 2010

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