TY - JOUR
T1 - Structural and phase changes in amorphous solid water films revealed by positron beam spectroscopy
AU - Wu, Y C
AU - Kallis, Alexis
AU - Jiang, J
AU - Coleman, Paul G
PY - 2010/8/6
Y1 - 2010/8/6
N2 - The evolution and annealing of pores in, and the crystallization of, vapor-deposited films of amorphous solid water have been studied by using variable-energy positron annihilation spectroscopy for temperatures in the range 50–150 K. Both positron and positronium annihilation provide insight to the nature of the grown-in pores and their evolution with temperature. Crystallization of the films was observed at just below 140 K, in agreement with earlier studies, with the topmost 80 nm undergoing a transition consistent with crystallization at 90–100 K.
AB - The evolution and annealing of pores in, and the crystallization of, vapor-deposited films of amorphous solid water have been studied by using variable-energy positron annihilation spectroscopy for temperatures in the range 50–150 K. Both positron and positronium annihilation provide insight to the nature of the grown-in pores and their evolution with temperature. Crystallization of the films was observed at just below 140 K, in agreement with earlier studies, with the topmost 80 nm undergoing a transition consistent with crystallization at 90–100 K.
UR - http://www.scopus.com/inward/record.url?scp=77955329216&partnerID=8YFLogxK
UR - http://dx.doi.org/10.1103/PhysRevLett.105.066103
U2 - 10.1103/PhysRevLett.105.066103
DO - 10.1103/PhysRevLett.105.066103
M3 - Article
SN - 0031-9007
VL - 105
JO - Physical Review Letters
JF - Physical Review Letters
IS - 6
M1 - 066103
ER -