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MC2- X-ray diffraction (XRD)
Material and Chemical Characterisation (MC2)Facility/equipment: Technology type
Lauren E. Hatcher, Jeppe Christensen, Michelle L. Hamilton, Jose Trincao, David R. Allan, Mark R. Warren, Ian P. Clarke, Michael Towrie, D S Fuertes, Charles C. Wilson, Christopher H. Woodall, Paul R. Raithby
Research output: Contribution to journal › Article › peer-review
Facility/equipment: Technology type