Abstract
Microscopy is an essential tool in a huge range of research areas. Until now, microscopy has been largely restricted to imaging in the visible region of the electromagnetic spectrum. Here we present a microscope system that uses single-pixel imaging techniques to produce images simultaneously in the visible and shortwave infrared. We apply our microscope to the inspection of various objects, including a silicon CMOS sensor, highlighting the complementarity of the visible and shortwave infrared wavebands. The system is capable of producing images with resolutions between 32×3232×32 and 128×128128×128 pixels at corresponding frame rates between 10 and 0.6 Hz. We introduce a compressive technique that does not require postprocessing, resulting in a predicted frame rate increase by a factor 8 from a compressive ratio of 12.5% with only 28% relative error.
Original language | English |
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Pages (from-to) | 285-289 |
Number of pages | 5 |
Journal | Optica |
Volume | 1 |
Issue number | 5 |
Early online date | 29 Oct 2014 |
DOIs | |
Publication status | Published - 20 Nov 2014 |