Electrical capacitance tomography (ECT) is an imaging method mainly capable of reconstructing dielectric permittivity. Generally, the reactance part of complex admittance is measured in a selected frequency. This paper presents for the first time an in depth and systematic analysis of complex admittance data for simultaneous reconstruction of both electrical conductivity and dielectric permittivity. A complex-valued forward model, Jacobian matrix and inverse solution are developed in the time harmonic excitation mode to allow for multi-frequency measurements. Realistic noise models are used to evaluate the performance of complex admittance ECT in a range of excitation frequencies. This paper demonstrates far greater potential for ECT as a versatile imaging tool through novel analysis of complex admittance imaging using a dual conductivity permittivity inversion method. The paper demonstrates that various classes of contactless capacitance based measurement devices can be analysed through complex multi-frequency ECT.
|Number of pages||13|
|Journal||Measurement Science and Technology|
|Early online date||4 Jan 2016|
|Publication status||Published - 28 Feb 2016|
FingerprintDive into the research topics of 'Simultaneous reconstruction of permittivity and conductivity using multi-frequency admittance measurement in electrical capacitance tomography'. Together they form a unique fingerprint.
- Department of Electronic & Electrical Engineering - Professor
- Electronics Materials, Circuits & Systems Research Unit (EMaCS)
- Centre for Digital, Manufacturing & Design (dMaDe)
Person: Research & Teaching, Core staff