Simultaneous reconstruction of permittivity and conductivity using multi-frequency admittance measurement in electrical capacitance tomography

Electrical capacitance tomography (ECT) is an imaging method mainly capable of reconstructing dielectric permittivity. Generally, the reactance part of complex admittance is measured in a selected frequency. This paper presents for the first time an in depth and systematic analysis of complex admittance data for simultaneous reconstruction of both electrical conductivity and dielectric permittivity. A complex-valued forward model, Jacobian matrix and inverse solution are developed in the time harmonic excitation mode to allow for multi-frequency measurements. Realistic noise models are used to evaluate the performance of complex admittance ECT in a range of excitation frequencies. This paper demonstrates far greater potential for ECT as a versatile imaging tool through novel analysis of complex admittance imaging using a dual conductivity permittivity inversion method. The paper demonstrates that various classes of contactless capacitance based measurement devices can be analysed through complex multi-frequency ECT.