Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

Asen Asenov, Andrew R. Brown, John H. Davies, Savas Kaya, G Slavcheva

Research output: Contribution to journalArticlepeer-review

475 Citations (Scopus)

Fingerprint Dive into the research topics of 'Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science