Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores

M A Anderson, A Tinsley-Bown, P Allcock, E A Perkins, P Snow, M Hollings, R G Smith, C Reeves, D J Squirrell, S Nicklin, T I Cox

Research output: Contribution to journalArticle

53 Citations (Scopus)
Original languageEnglish
Pages (from-to)528-533
Number of pages6
JournalPhysica Status Solidi A: Applications and Materials Science
Volume197
Issue number2
Publication statusPublished - 2003

Cite this

Anderson, M. A., Tinsley-Bown, A., Allcock, P., Perkins, E. A., Snow, P., Hollings, M., Smith, R. G., Reeves, C., Squirrell, D. J., Nicklin, S., & Cox, T. I. (2003). Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores. Physica Status Solidi A: Applications and Materials Science, 197(2), 528-533.