Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation

A P Knights, P G Coleman

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)
Original languageEnglish
Title of host publicationPositron Annihilation - Icpa-13, Proceedings
Pages123-125
Number of pages3
Volume445-4
Publication statusPublished - 2004

Publication series

NameMaterials Science Forum

Cite this

Knights, A. P., & Coleman, P. G. (2004). Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. In Positron Annihilation - Icpa-13, Proceedings (Vol. 445-4, pp. 123-125). (Materials Science Forum).

Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. / Knights, A P; Coleman, P G.

Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4 2004. p. 123-125 (Materials Science Forum).

Research output: Chapter in Book/Report/Conference proceedingChapter

Knights, AP & Coleman, PG 2004, Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. in Positron Annihilation - Icpa-13, Proceedings. vol. 445-4, Materials Science Forum, pp. 123-125.
Knights AP, Coleman PG. Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. In Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. 2004. p. 123-125. (Materials Science Forum).
Knights, A P ; Coleman, P G. / Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4 2004. pp. 123-125 (Materials Science Forum).
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