| Original language | English |
|---|---|
| Title of host publication | Positron Annihilation - Icpa-13, Proceedings |
| Pages | 123-125 |
| Number of pages | 3 |
| Volume | 445-4 |
| Publication status | Published - 2004 |
Publication series
| Name | Materials Science Forum |
|---|
Cite this
Knights, A. P., & Coleman, P. G. (2004). Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. In Positron Annihilation - Icpa-13, Proceedings (Vol. 445-4, pp. 123-125). (Materials Science Forum).
Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. / Knights, A P; Coleman, P G.
Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4 2004. p. 123-125 (Materials Science Forum).Research output: Chapter in Book/Report/Conference proceeding › Chapter
Knights, AP & Coleman, PG 2004, Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. in Positron Annihilation - Icpa-13, Proceedings. vol. 445-4, Materials Science Forum, pp. 123-125.
Knights AP, Coleman PG. Sensitivity of positron annihilation spectroscopy to energy contamination in low energy boron ion implantation. In Positron Annihilation - Icpa-13, Proceedings. Vol. 445-4. 2004. p. 123-125. (Materials Science Forum).
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