Self-implantation of Cz-Si: Clustering and annealing of defects

D A Abdulmalik, P G Coleman, I Y Al-Qaradawi

Research output: Contribution to journal › Article › peer-review

8 Citations (SciVal)

ID number: ISI:000236021300020

Cite this

@article{fc5415b7a84247c3a8bcfa832dd0a67c,

title = "Self-implantation of Cz-Si: Clustering and annealing of defects",

author = "Abdulmalik, \{D A\} and Coleman, \{P G\} and Al-Qaradawi, \{I Y\}",

note = "ID number: ISI:000236021300020",

year = "2006",

language = "English",

volume = "252",

pages = "3209--3214",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

number = "9",

}

TY - JOUR

T1 - Self-implantation of Cz-Si: Clustering and annealing of defects

AU - Abdulmalik, D A

AU - Coleman, P G

AU - Al-Qaradawi, I Y

N1 - ID number: ISI:000236021300020

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/32644457277

M3 - Article

SN - 0169-4332

VL - 252

SP - 3209

EP - 3214

JO - Applied Surface Science

JF - Applied Surface Science

IS - 9

ER -