Second-harmonic generation from complex chiral samples

M. Vanbel, S. Vandendriessche, M. A. Van Der Veen, D. Slavov, P. Heister, R. Paesen, V. K. Valev, M. Ameloot, T. Verbiest

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Second harmonic generation microscopy has recently become an important tool for studying materials. In this article, we use a recently developed analytical method, for second-harmonic generation microscopy, to determine the point group symmetry of micro crystals of enantiomerically pure 1, 1'-bi-2-naphtol.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8770
DOIs
Publication statusPublished - 22 Jul 2013
Event17th International School on Quantum Electronics: Laser Physics and Applications, ISQE 2012 - Nessebar, UK United Kingdom
Duration: 24 Sep 201228 Sep 2012

Conference

Conference17th International School on Quantum Electronics: Laser Physics and Applications, ISQE 2012
CountryUK United Kingdom
CityNessebar
Period24/09/1228/09/12

Keywords

  • Chirality
  • Microscopy
  • Second-harmonic generation
  • Symmetry

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  • Cite this

    Vanbel, M., Vandendriessche, S., Van Der Veen, M. A., Slavov, D., Heister, P., Paesen, R., Valev, V. K., Ameloot, M., & Verbiest, T. (2013). Second-harmonic generation from complex chiral samples. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8770). [87701F] https://doi.org/10.1117/12.2014745