Scanning probe microscopy using attobcube systems positioners down to 300mK

Simon Bending; Volodya Khotkevych; Milorad Milosevic

Scanning probe microscopy using attobcube systems positioners down to 300mK

Simon Bending, Volodya Khotkevych, Milorad Milosevic

Department of Physics

University of Antwerp

Research output: Other contribution

Abstract

Application note describing use of attocube systems positioners in a millikelvin scanning probe microscope developed at the University of Bath.

Original language	English
Type	Application Note
Media of output	On-line article
Publisher	Attocube systems AG
Number of pages	1
Place of Publication	München
Publication status	Published - 25 Nov 2009

Bibliographical note

Application note

Keywords

Scanning probe microscopy
mK temperatures

Cite this

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title = "Scanning probe microscopy using attobcube systems positioners down to 300mK",

abstract = "Application note describing use of attocube systems positioners in a millikelvin scanning probe microscope developed at the University of Bath.",

keywords = "Scanning probe microscopy, mK temperatures",

author = "Simon Bending and Volodya Khotkevych and Milorad Milosevic",

note = "Application note",

year = "2009",

month = nov,

day = "25",

language = "English",

publisher = "Attocube systems AG",

type = "Other",

}

TY - GEN

T1 - Scanning probe microscopy using attobcube systems positioners down to 300mK

AU - Bending, Simon

AU - Khotkevych, Volodya

AU - Milosevic, Milorad

N1 - Application note

PY - 2009/11/25

Y1 - 2009/11/25

N2 - Application note describing use of attocube systems positioners in a millikelvin scanning probe microscope developed at the University of Bath.

AB - Application note describing use of attocube systems positioners in a millikelvin scanning probe microscope developed at the University of Bath.

KW - Scanning probe microscopy

KW - mK temperatures

UR - http://www.attocube.com/nanoSCOPY/download/ACS_AppNote_M29_SHPM_ANPxyz101.pdf

UR - http://www.attocube.com/

M3 - Other contribution

PB - Attocube systems AG

CY - München

ER -

Scanning probe microscopy using attobcube systems positioners down to 300mK

Abstract

Bibliographical note

Keywords

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Cite this