Scanning probe microscopy using attobcube systems positioners down to 300mK

Simon Bending, Volodya Khotkevych, Milorad Milosevic

Research output: Other contribution

Abstract

Application note describing use of attocube systems positioners in a millikelvin scanning probe microscope developed at the University of Bath.
LanguageEnglish
TypeApplication Note
PublisherAttocube systems AG
Number of pages1
Place of PublicationMünchen
StatusPublished - 25 Nov 2009

Fingerprint

scanning probe microscopy
microscopes
probes (equipment)

Keywords

  • Scanning probe microscopy
  • mK temperatures

Cite this

Bending, S., Khotkevych, V., & Milosevic, M. (2009, Nov 25). Scanning probe microscopy using attobcube systems positioners down to 300mK. München: Attocube systems AG.

Scanning probe microscopy using attobcube systems positioners down to 300mK. / Bending, Simon; Khotkevych, Volodya; Milosevic, Milorad.

1 p. München : Attocube systems AG. 2009, Application Note.

Research output: Other contribution

Bending, S, Khotkevych, V & Milosevic, M 2009, Scanning probe microscopy using attobcube systems positioners down to 300mK. Attocube systems AG, München.
Bending, Simon ; Khotkevych, Volodya ; Milosevic, Milorad. / Scanning probe microscopy using attobcube systems positioners down to 300mK. 2009. München : Attocube systems AG. 1 p.
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