Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis

Julian Stirling, Richard AJ Woolley, Philip Moriarty

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.
Original languageEnglish
Number of pages6
JournalReview of Scientific Instruments
Volume84
Issue number11
Early online date1 Nov 2013
DOIs
Publication statusE-pub ahead of print - 1 Nov 2013

Cite this