Scanning Hall probe imaging of nanoscale magnetic structures

S J Bending, V V Khotkevych

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.
Original languageEnglish
Pages (from-to)503-506
Number of pages4
JournalSensor Letters
Volume7
Issue number3
DOIs
Publication statusPublished - Jun 2009

Fingerprint

Magnetic structure
microscopy
Scanning
Imaging techniques
scanning
ferromagnetic materials
magnetic force microscopy
probes
magnetic induction
sensors
Microscopic examination
imaging techniques
Magnetic force microscopy
Nanosensors
magnetic measurement
Hall effect
Ferromagnetic materials
Electromagnetic induction
Sensors
Superconducting materials

Cite this

Scanning Hall probe imaging of nanoscale magnetic structures. / Bending, S J; Khotkevych, V V.

In: Sensor Letters, Vol. 7, No. 3, 06.2009, p. 503-506.

Research output: Contribution to journalArticle

Bending, S J ; Khotkevych, V V. / Scanning Hall probe imaging of nanoscale magnetic structures. In: Sensor Letters. 2009 ; Vol. 7, No. 3. pp. 503-506.
@article{74e5d1156d204d9b8601a7d6fd640f7d,
title = "Scanning Hall probe imaging of nanoscale magnetic structures",
abstract = "Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.",
author = "Bending, {S J} and Khotkevych, {V V}",
year = "2009",
month = "6",
doi = "10.1166/sl.2009.1099",
language = "English",
volume = "7",
pages = "503--506",
journal = "Sensor Letters",
issn = "1546-198X",
publisher = "American Scientific Publishers",
number = "3",

}

TY - JOUR

T1 - Scanning Hall probe imaging of nanoscale magnetic structures

AU - Bending, S J

AU - Khotkevych, V V

PY - 2009/6

Y1 - 2009/6

N2 - Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.

AB - Scanning Hall probe microscopy (SHPM) is a novel magnetic imaging technique based on Hall-effect nanosensors with important applications in the quantitative mapping of nanoscale superconducting and ferromagnetic materials. It is highly complementary to other imaging approaches, e.g., Magnetic Force Microscopy (MFM). SHPM is almost completely non-invasive, can be used over a wide range of temperatures (0.3-300 K) and magnetic fields (0-7 T) and is particularly valuable when quantitative maps of magnetic induction are required with very high signal:noise ratios. Recent developments in sensor technology will be described and illustrated by relevant imaging case studies. In addition applications of nanoscale Hall sensors in micro-magnetometry will be reviewed.

UR - http://www.scopus.com/inward/record.url?scp=73149103177&partnerID=8YFLogxK

UR - http://dx.doi.org/10.1166/sl.2009.1099

U2 - 10.1166/sl.2009.1099

DO - 10.1166/sl.2009.1099

M3 - Article

VL - 7

SP - 503

EP - 506

JO - Sensor Letters

JF - Sensor Letters

SN - 1546-198X

IS - 3

ER -