Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

V. K. Valev; B. De Clercq; X. Zheng; C. G. Biris; N. C. Panoiu; A. V. Silhanek; V. Volskiy; O. A. Aktsipetrov; G. A E Vandenbosch; M. Ameloot; V. V. Moshchalkov; T. Verbiest

doi:10.1117/12.922880

Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

V. K. Valev, B. De Clercq, X. Zheng, C. G. Biris, N. C. Panoiu, A. V. Silhanek, V. Volskiy, O. A. Aktsipetrov, G. A E Vandenbosch, M. Ameloot, V. V. Moshchalkov, T. Verbiest

Department of Physics

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Abstract

Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8424
DOIs	https://doi.org/10.1117/12.922880
Publication status	Published - 11 Jul 2012
Event	Nanophotonics IV - Brussels, UK United Kingdom Duration: 15 Apr 2012 → 19 Apr 2012

Conference

Conference	Nanophotonics IV
Country/Territory	UK United Kingdom
City	Brussels
Period	15/04/12 → 19/04/12

Keywords

metamaterials
nanostructures
plasmonics
Second Harmonic Generation

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10.1117/12.922880

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Valev, V. K., De Clercq, B., Zheng, X., Biris, C. G., Panoiu, N. C., Silhanek, A. V., Volskiy, V., Aktsipetrov, O. A., Vandenbosch, G. A. E., Ameloot, M., Moshchalkov, V. V., & Verbiest, T. (2012). Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8424). Article 842411 https://doi.org/10.1117/12.922880

Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. / Valev, V. K.; De Clercq, B.; Zheng, X. et al.
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8424 2012. 842411.

Research output: Chapter or section in a book/report/conference proceeding › Chapter in a published conference proceeding

Valev, VK, De Clercq, B, Zheng, X, Biris, CG, Panoiu, NC, Silhanek, AV, Volskiy, V, Aktsipetrov, OA, Vandenbosch, GAE, Ameloot, M, Moshchalkov, VV & Verbiest, T 2012, Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8424, 842411, Nanophotonics IV, Brussels, UK United Kingdom, 15/04/12. https://doi.org/10.1117/12.922880

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abstract = "Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.",

keywords = "metamaterials, nanostructures, plasmonics, Second Harmonic Generation",

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AU - Valev, V. K.

AU - De Clercq, B.

AU - Zheng, X.

AU - Biris, C. G.

AU - Panoiu, N. C.

AU - Silhanek, A. V.

AU - Volskiy, V.

AU - Aktsipetrov, O. A.

AU - Vandenbosch, G. A E

AU - Ameloot, M.

AU - Moshchalkov, V. V.

AU - Verbiest, T.

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AB - Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.

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Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

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