Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials

V. K. Valev, B. De Clercq, X. Zheng, C. G. Biris, N. C. Panoiu, A. V. Silhanek, V. Volskiy, O. A. Aktsipetrov, G. A E Vandenbosch, M. Ameloot, V. V. Moshchalkov, T. Verbiest

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8424
DOIs
Publication statusPublished - 11 Jul 2012
EventNanophotonics IV - Brussels, UK United Kingdom
Duration: 15 Apr 201219 Apr 2012

Conference

ConferenceNanophotonics IV
CountryUK United Kingdom
CityBrussels
Period15/04/1219/04/12

Keywords

  • metamaterials
  • nanostructures
  • plasmonics
  • Second Harmonic Generation

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    Valev, V. K., De Clercq, B., Zheng, X., Biris, C. G., Panoiu, N. C., Silhanek, A. V., Volskiy, V., Aktsipetrov, O. A., Vandenbosch, G. A. E., Ameloot, M., Moshchalkov, V. V., & Verbiest, T. (2012). Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8424). [842411] https://doi.org/10.1117/12.922880