Rigorous analysis of the higher order modes and attenuation of stripline of arbitrary dimensions

M. H. Burchett, S. R. Pennock, P. R. Shepherd

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a rigorous and computationally efficient analysis for stripline of arbitrary dimensions based on the Transverse Resonance Diffraction technique. Calculated higher order mode cutoff frequencies show excellent agreement, and attenuation factor shows good agreement with measured values, and are more accurate than predictions from numerical or analytical techniques.

Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherIEEE
Pages1451-1454
Number of pages4
ISBN (Print)0780312090
Publication statusPublished - 1 Jan 1993
EventProceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4) - Atlanta, GA, USA
Duration: 14 Jun 199318 Jun 1993

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume3
ISSN (Print)0149-645X

Conference

ConferenceProceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4)
CityAtlanta, GA, USA
Period14/06/9318/06/93

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Burchett, M. H., Pennock, S. R., & Shepherd, P. R. (1993). Rigorous analysis of the higher order modes and attenuation of stripline of arbitrary dimensions. In IEEE MTT-S International Microwave Symposium Digest (pp. 1451-1454). (IEEE MTT-S International Microwave Symposium Digest; Vol. 3). IEEE.