Resolution Analysis Using Fully 3D Electrical Capacitive Tomography

Zhuoyi Ye; H Wei; Manuchehr Soleimani

doi:10.1016/j.measurement.2014.10.060

Resolution Analysis Using Fully 3D Electrical Capacitive Tomography

Zhuoyi Ye, H Wei, Manuchehr Soleimani

Department of Electronic & Electrical Engineering

Industrial Tomography Systems PLC

Research output: Contribution to journal › Article › peer-review

27 Citations (SciVal)

480 Downloads (Pure)

Original language	English
Pages (from-to)	270-279
Journal	Measurement
Volume	61
Early online date	13 Nov 2014
DOIs	https://doi.org/10.1016/j.measurement.2014.10.060
Publication status	Published - Feb 2015

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10.1016/j.measurement.2014.10.060

Fully3D_V18Submitted manuscript, 1.3 MBLicence: CC BY-NC-ND

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title = "Resolution Analysis Using Fully 3D Electrical Capacitive Tomography",

author = "Zhuoyi Ye and H Wei and Manuchehr Soleimani",

year = "2015",

month = feb,

doi = "10.1016/j.measurement.2014.10.060",

language = "English",

volume = "61",

pages = "270--279",

journal = "Measurement",

issn = "0263-2241",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Resolution Analysis Using Fully 3D Electrical Capacitive Tomography

AU - Ye, Zhuoyi

AU - Wei, H

AU - Soleimani, Manuchehr

PY - 2015/2

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UR - http://dx.doi.org/10.1016/j.measurement.2014.10.060

U2 - 10.1016/j.measurement.2014.10.060

DO - 10.1016/j.measurement.2014.10.060

M3 - Article

SN - 0263-2241

VL - 61

SP - 270

EP - 279

JO - Measurement

JF - Measurement

ER -

Resolution Analysis Using Fully 3D Electrical Capacitive Tomography

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Manuchehr Soleimani

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