Equipment
Search results
-
MC2-Electron Microscopy (EM)
Material and Chemical Characterisation (MC2)Facility/equipment: Technology type
Daping He, Erwan Rauwel, Richard Malpass-Evans, Mariolino Carta, Neil B. McKeown, Demudu Babu Gorle, M. Anbu Kulandainathan, Frank Marken
Research output: Contribution to journal › Article › peer-review
Facility/equipment: Technology type