Raman Spectroscopy

Daniel Wolverson

doi:10.1016/B978-0-444-59551-5.00017-0

Raman Spectroscopy

Daniel Wolverson

Department of Physics

Research output: Chapter or section in a book/report/conference proceeding › Chapter or section

4 Citations (SciVal)

Abstract

An introduction to the theory of Raman scattering and the effects of symmetry on theselection rules governing the scattering process is followed by a brief review of developments inexperimental technique. An overview of some recent results in the application of Ramanspectroscopy to the study of low-dimensional semiconductors is then given, with somecomments on the likely development of the field.

Original language	English
Title of host publication	Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.)
Editors	Carlo Lamberti, Giovanni Agostini
Place of Publication	Amsterdam, Netherlands
Publisher	Elsevier
Pages	753-802
Number of pages	49
Edition	2nd
ISBN (Print)	9780444595515
DOIs	https://doi.org/10.1016/B978-0-444-59551-5.00017-0
Publication status	Published - 4 Mar 2013

Keywords

Raman spectroscopy

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10.1016/B978-0-444-59551-5.00017-0

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AB - An introduction to the theory of Raman scattering and the effects of symmetry on theselection rules governing the scattering process is followed by a brief review of developments inexperimental technique. An overview of some recent results in the application of Ramanspectroscopy to the study of low-dimensional semiconductors is then given, with somecomments on the likely development of the field.

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UR - http://dx.doi.org/10.1016/B978-0-444-59551-5.00017-0

U2 - 10.1016/B978-0-444-59551-5.00017-0

DO - 10.1016/B978-0-444-59551-5.00017-0

M3 - Chapter or section

SN - 9780444595515

SP - 753

EP - 802

BT - Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.)

A2 - Lamberti, Carlo

A2 - Agostini, Giovanni

PB - Elsevier

CY - Amsterdam, Netherlands

ER -

Raman Spectroscopy

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Keywords

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