An introduction to the theory of Raman scattering and the effects of symmetry on theselection rules governing the scattering process is followed by a brief review of developments inexperimental technique. An overview of some recent results in the application of Ramanspectroscopy to the study of low-dimensional semiconductors is then given, with somecomments on the likely development of the field.
|Title of host publication||Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.)|
|Editors||Carlo Lamberti, Giovanni Agostini|
|Place of Publication||Amsterdam, Netherlands|
|Number of pages||49|
|Publication status||Published - 4 Mar 2013|
- Raman spectroscopy
Wolverson, D. (2013). Raman Spectroscopy. In C. Lamberti, & G. Agostini (Eds.), Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.) (2nd ed., pp. 753-802). Elsevier. https://doi.org/10.1016/B978-0-444-59551-5.00017-0