Raman Spectroscopy

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Citations (Scopus)

Abstract

An introduction to the theory of Raman scattering and the effects of symmetry on theselection rules governing the scattering process is followed by a brief review of developments inexperimental technique. An overview of some recent results in the application of Ramanspectroscopy to the study of low-dimensional semiconductors is then given, with somecomments on the likely development of the field.
Original languageEnglish
Title of host publicationCharacterization of Semiconductor Heterostructures and Nanostructures (2nd ed.)
EditorsCarlo Lamberti, Giovanni Agostini
Place of PublicationAmsterdam, Netherlands
PublisherElsevier
Pages753-802
Number of pages49
Edition2nd
ISBN (Print)9780444595515
DOIs
Publication statusPublished - 4 Mar 2013

Fingerprint

Raman spectroscopy
scattering
symmetry
semiconductor
effect

Keywords

  • Raman spectroscopy

Cite this

Wolverson, D. (2013). Raman Spectroscopy. In C. Lamberti, & G. Agostini (Eds.), Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.) (2nd ed., pp. 753-802). Amsterdam, Netherlands: Elsevier. https://doi.org/10.1016/B978-0-444-59551-5.00017-0

Raman Spectroscopy. / Wolverson, Daniel.

Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.). ed. / Carlo Lamberti; Giovanni Agostini. 2nd. ed. Amsterdam, Netherlands : Elsevier, 2013. p. 753-802.

Research output: Chapter in Book/Report/Conference proceedingChapter

Wolverson, D 2013, Raman Spectroscopy. in C Lamberti & G Agostini (eds), Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.). 2nd edn, Elsevier, Amsterdam, Netherlands, pp. 753-802. https://doi.org/10.1016/B978-0-444-59551-5.00017-0
Wolverson D. Raman Spectroscopy. In Lamberti C, Agostini G, editors, Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.). 2nd ed. Amsterdam, Netherlands: Elsevier. 2013. p. 753-802 https://doi.org/10.1016/B978-0-444-59551-5.00017-0
Wolverson, Daniel. / Raman Spectroscopy. Characterization of Semiconductor Heterostructures and Nanostructures (2nd ed.). editor / Carlo Lamberti ; Giovanni Agostini. 2nd. ed. Amsterdam, Netherlands : Elsevier, 2013. pp. 753-802
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