Raman Spectroscopy

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

An introduction to the theory of Raman scattering and the effects of symmetry on the selection rules governing the scattering process is followed by a brief review of developments in experimental technique. An overview of some recent results in the application of Raman spectroscopy to the study of low-dimensional semiconductors is then given, with some comments on the likely development of the field.
Original languageEnglish
Title of host publicationCharacterization of Semiconductor Heterostructures and Nanostructures
EditorsCarlo Lamberti
Place of PublicationAmsterdam
PublisherElsevier
Pages249-288
Number of pages40
ISBN (Print)9780444530998
Publication statusPublished - 1 Sep 2008

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Raman spectroscopy
Raman scattering
Scattering
Semiconductor materials

Cite this

Wolverson, D. (2008). Raman Spectroscopy. In C. Lamberti (Ed.), Characterization of Semiconductor Heterostructures and Nanostructures (pp. 249-288). Amsterdam: Elsevier.

Raman Spectroscopy. / Wolverson, Daniel.

Characterization of Semiconductor Heterostructures and Nanostructures. ed. / Carlo Lamberti. Amsterdam : Elsevier, 2008. p. 249-288.

Research output: Chapter in Book/Report/Conference proceedingChapter

Wolverson, D 2008, Raman Spectroscopy. in C Lamberti (ed.), Characterization of Semiconductor Heterostructures and Nanostructures. Elsevier, Amsterdam, pp. 249-288.
Wolverson D. Raman Spectroscopy. In Lamberti C, editor, Characterization of Semiconductor Heterostructures and Nanostructures. Amsterdam: Elsevier. 2008. p. 249-288
Wolverson, Daniel. / Raman Spectroscopy. Characterization of Semiconductor Heterostructures and Nanostructures. editor / Carlo Lamberti. Amsterdam : Elsevier, 2008. pp. 249-288
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