Quantitative simulation of in situ reflectance data from metal organic vapour phase epitaxy of GaN on sapphire

Chaowang Liu, Ian M. Watson

Research output: Contribution to journalArticlepeer-review

18 Citations (SciVal)
Original languageEnglish
Pages (from-to)629-635
Number of pages7
JournalSemiconductor Science and Technology
Issue number6
Publication statusPublished - 1 Jun 2007

Bibliographical note

ID number: ISI:000247046900008

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