Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal

R. Capelli, E. Da Como, G. Kociok-Köhn, C. Fontanesi, A. Verna, L. Pasquali

Research output: Contribution to journal › Article › peer-review

4 Citations (SciVal)

1 results
- Title(descending)

Dual source (Cu and Mo) Single Crystal Diffractometer (SuperNova)
Material and Chemical Characterisation (MC2)
Facility/equipment: Equipment