Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal

R. Capelli, E. Da Como, G. Kociok-Köhn, C. Fontanesi, A. Verna, L. Pasquali

Research output: Contribution to journalArticle

Abstract

Resonant soft X-ray reflectivity at the carbon K-edge was applied to a trigonal tetracene single crystal. The angular resolved reflectivity was quantitatively simulated describing the tetracene crystal in terms of its dielectric tensor, which was derived from the anisotropic absorption cross section of the single molecule, as calculated by density functional theory. A good agreement was found between the experimental and theoretically predicted reflectivity. This allows us to assess the anisotropic optical constants of the organic material, probed at the carbon K-edge, in relation to the bulk/surface structural and electronic properties of the crystal, through empty energy levels.

Original languageEnglish
Article number094707
JournalJournal of Chemical Physics
Volume150
Issue number9
Early online date5 Mar 2019
DOIs
Publication statusE-pub ahead of print - 5 Mar 2019

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Cite this

Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal. / Capelli, R.; Da Como, E.; Kociok-Köhn, G.; Fontanesi, C.; Verna, A.; Pasquali, L.

In: Journal of Chemical Physics, Vol. 150, No. 9, 094707, 05.03.2019.

Research output: Contribution to journalArticle

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