TY - JOUR
T1 - Quantitative analysis of cathodoluminescence phenomena in InGaN/GaN QW by Monte Carlo method
AU - Priesol, J.
AU - Šatka, A.
AU - Uherek, F.
AU - Donoval, D.
AU - Shields, P.
AU - Allsopp, D.W.E.
PY - 2013/3/15
Y1 - 2013/3/15
N2 - In this paper, cathodoluminescence from InGaN/GaN single quantum wells grown on the facets of the GaN nano-pyramids has been quantitatively studied by Monte Carlo method. The influence of primary electron beam energy and the nanopyramid angle on generation of electron-hole pairs in individual parts of nanostructure has been studied by Monte Carlo simulations. The evolution of the GaN- and InGaN-related cathodoluminescence spectral lines with primary electron beam energy and angle of incidence has been assessed from the recombination rates in individual parts of the structure and compared with cathodoluminescence spectra measured at various beam energies. The possibility to determine the diffusion length of generated carriers in the structures like InGaN/GaN quantum wells using developed Monte Carlo simulator and CL measurements has been demonstrated.
AB - In this paper, cathodoluminescence from InGaN/GaN single quantum wells grown on the facets of the GaN nano-pyramids has been quantitatively studied by Monte Carlo method. The influence of primary electron beam energy and the nanopyramid angle on generation of electron-hole pairs in individual parts of nanostructure has been studied by Monte Carlo simulations. The evolution of the GaN- and InGaN-related cathodoluminescence spectral lines with primary electron beam energy and angle of incidence has been assessed from the recombination rates in individual parts of the structure and compared with cathodoluminescence spectra measured at various beam energies. The possibility to determine the diffusion length of generated carriers in the structures like InGaN/GaN quantum wells using developed Monte Carlo simulator and CL measurements has been demonstrated.
UR - http://www.scopus.com/inward/record.url?scp=84875417347&partnerID=8YFLogxK
UR - http://dx.doi.org/10.1016/j.apsusc.2012.09.158
U2 - 10.1016/j.apsusc.2012.09.158
DO - 10.1016/j.apsusc.2012.09.158
M3 - Article
SN - 0169-4332
VL - 269
SP - 155
EP - 160
JO - Applied Surface Science
JF - Applied Surface Science
ER -