Quantification of biofilm thickness using a swept source based optical coherence tomography system

M. Ratheesh Kumar, V. M. Murukeshan, L. K. Seah, C. Shearwood

    Research output: Chapter or section in a book/report/conference proceedingChapter in a published conference proceeding

    6 Citations (SciVal)

    Abstract

    Optical coherence tomography (OCT) is a non-invasive, non-contact optical measurement and imaging technique that relies on low coherence interferometry. Apart from bio-imaging applications, the applicability of OCT can be extended to metrological investigations because of the inherent capability of optical interferometry to perform precise measurement with high sensitivity. In this paper, we demonstrate the feasibility of OCT for the measurement of the refractive index and thickness of bacterial biofilm structures grown in a flow cell. In OCT, the depth profiles are constructed by measuring the magnitude and time delay of back reflected light from the scattering sites by means of optical interferometry. The optical distance between scattering points can be obtained by measuring the separation between the point spread functions (PSF) at the respective points in the A-scan data. The refractive index of the biofilm is calculated by measuring the apparent shift in the position of the PSF corresponding to a reference surface, caused by the biofilm growth. In our experiment, the base layer of the flow cell is used as the reference surface. It is observed that the calculated refractive index of the biofilm is close to that of water, and agrees well with the previously reported value. Finally, the physical thickness of the biofilm is calculated by dividing the optical path length by the calculated value of refractive index.

    Original languageEnglish
    Title of host publicationInternational Conference on Optical and Photonic Engineering, icOPEN 2015
    EditorsYu Fu, Anand K. Asundi
    Place of PublicationU. S. A.
    PublisherSPIE
    ISBN (Electronic)9781628416848
    DOIs
    Publication statusPublished - 2015
    Event3rd International Conference on Optical and Photonic Engineering, icOPEN 2015 - Singapore, Singapore
    Duration: 14 Apr 201516 Apr 2015

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume9524
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    Conference3rd International Conference on Optical and Photonic Engineering, icOPEN 2015
    Country/TerritorySingapore
    CitySingapore
    Period14/04/1516/04/15

    Keywords

    • Bio-film
    • Optical coherence tomography
    • Optical frequency domain reflectometry
    • Thickness measurement

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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