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Abstract
Proximity effects causing thickening and bending of closely spaced, free-standing pillars grown by electron-beam-induced deposition are investigated. It is shown that growth of a new pillar induces deposition of a layer of additional material on the side of already grown pillars facing the new pillar. We present experimental results which suggest that the bending of pillars is caused by shrinkage of the newly formed layer on exposure to the primary electron beam.
Original language | English |
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Article number | 285308 |
Journal | Nanotechnology |
Volume | 20 |
Issue number | 28 |
DOIs | |
Publication status | Published - 2009 |
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Dive into the research topics of 'Proximity effects in free-standing EBID structures'. Together they form a unique fingerprint.Projects
- 1 Finished
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NANOTRACKING THE MOLECULE'S FATE IN LIVING CELLS SPLIT SP 75% SH 25% NB 75OHD=FACILITIES DO NOT SPLIT ALL SP
Gordeev, S. (PI), Moskalenko, A. (CoI) & Smirnov, S. (CoI)
Engineering and Physical Sciences Research Council
1/02/07 → 31/03/08
Project: Research council