Potential fluctuations due to the randomly distributed charges at the semiconductor-insulator interface in MIS-structures

G Slavcheva, Ivan Yanchev

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)101-105
JournalAnnuaire de l' Universite de Sofia 'St. Kliment. Ohridski': Physique et Technologie des Semiconducteurs
Volume84
Publication statusPublished - 1993

Cite this

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title = "Potential fluctuations due to the randomly distributed charges at the semiconductor-insulator interface in MIS-structures",
author = "G Slavcheva and Ivan Yanchev",
year = "1993",
language = "English",
volume = "84",
pages = "101--105",
journal = "Annuaire de l' Universite de Sofia 'St. Kliment. Ohridski': Physique et Technologie des Semiconducteurs",

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T1 - Potential fluctuations due to the randomly distributed charges at the semiconductor-insulator interface in MIS-structures

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AU - Yanchev, Ivan

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JO - Annuaire de l' Universite de Sofia 'St. Kliment. Ohridski': Physique et Technologie des Semiconducteurs

JF - Annuaire de l' Universite de Sofia 'St. Kliment. Ohridski': Physique et Technologie des Semiconducteurs

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