Potential fluctuations due to the randomly distributed charges at the semiconductor-insulator interface in MIS-structures

G Slavcheva, Ivan Yanchev

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)101-105
JournalAnnuaire de l' Universite de Sofia 'St. Kliment. Ohridski': Physique et Technologie des Semiconducteurs
Volume84
Publication statusPublished - 1993

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