Positron depth profiling in solid surface layers

R I Grynszpan, W Anwand, G Brauer, P G Coleman

Research output: Contribution to journal › Article › peer-review

8 Citations (SciVal)

Original language	English
Pages (from-to)	365-382
Number of pages	18
Journal	Annales De Chimie-Science Des Materiaux
Volume	32 Jul-Aug
Issue number	4
Publication status	Published - 2007

ID number: ISI:000248828100005

Cite this

@article{92da35f3a8804b9b8a6313fa4454e53e,

title = "Positron depth profiling in solid surface layers",

author = "Grynszpan, \{R I\} and W Anwand and G Brauer and Coleman, \{P G\}",

note = "ID number: ISI:000248828100005",

year = "2007",

language = "English",

volume = "32 Jul-Aug",

pages = "365--382",

journal = "Annales De Chimie-Science Des Materiaux",

issn = "0151-9107",

publisher = "International Information and Engineering Technology Association",

number = "4",

}

TY - JOUR

T1 - Positron depth profiling in solid surface layers

AU - Grynszpan, R I

AU - Anwand, W

AU - Brauer, G

AU - Coleman, P G

N1 - ID number: ISI:000248828100005

PY - 2007

Y1 - 2007

UR - https://www.scopus.com/pages/publications/34548039685

M3 - Article

SN - 0151-9107

VL - 32 Jul-Aug

SP - 365

EP - 382

JO - Annales De Chimie-Science Des Materiaux

JF - Annales De Chimie-Science Des Materiaux

IS - 4

ER -