Positron depth profiling in solid surface layers

R I Grynszpan, W Anwand, G Brauer, P G Coleman

Research output: Contribution to journalArticle

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)365-382
Number of pages18
JournalAnnales De Chimie-Science Des Materiaux
Volume32 Jul-Aug
Issue number4
Publication statusPublished - 2007

Cite this

Grynszpan, R. I., Anwand, W., Brauer, G., & Coleman, P. G. (2007). Positron depth profiling in solid surface layers. Annales De Chimie-Science Des Materiaux, 32 Jul-Aug(4), 365-382.