Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2

X D Pi, P G Coleman, R Harding, G Davies, R M Gwilliam, B J Sealy

Research output: Contribution to journal › Article › peer-review

3 Citations (SciVal)

ID number: ISI:000188300200231

Cite this

@article{d0ea859ca5ec4e70863cfe08a1983d55,

title = "Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2",

author = "Pi, \{X D\} and Coleman, \{P G\} and R Harding and G Davies and Gwilliam, \{R M\} and Sealy, \{B J\}",

note = "ID number: ISI:000188300200231",

year = "2003",

language = "English",

volume = "340",

pages = "1094--1098",

journal = "Physica B Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2

AU - Pi, X D

AU - Coleman, P G

AU - Harding, R

AU - Davies, G

AU - Gwilliam, R M

AU - Sealy, B J

N1 - ID number: ISI:000188300200231

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0346055256

M3 - Article

SN - 0921-4526

VL - 340

SP - 1094

EP - 1098

JO - Physica B Condensed Matter

JF - Physica B Condensed Matter

ER -