Positron annihilation spectroscopy of the interface between nanocrystalline Si and SiO2

X D Pi, P G Coleman, R Harding, G Davies, R M Gwilliam, B J Sealy

Research output: Contribution to journalArticlepeer-review

3 Citations (SciVal)
Original languageEnglish
Pages (from-to)1094-1098
Number of pages5
JournalPhysica B Condensed Matter
Publication statusPublished - 2003

Bibliographical note

ID number: ISI:000188300200231

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