Abstract
This paper describes a measurement on a GaAs quantum well waveguide with a high built in field across the quantum wells at a wavelength far from the bandedge. The device structure used for the measurement has been fabricated at STC Technology Ltd and is that of a standard laser ridge structure. In fabrication double heterostructure layers are grown on a [001] n + GaAs substrate, with the active region containing two intrinsic GaAs quantum wells of 10nm thickness separated by 10nm. A 4μm wide ridge is etched to provide transverse optical guiding. The experimental work has involved the use of 1.06μm wavelength light from a Q-switched Nd:YAG laser. Any induced change in refractive index is determined by measuring the change in transmission of the quantum well waveguide Fabry-Perot cavity. The waveguide is placed on a Peltier temperature controller to allow thermal tuning.
Original language | English |
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Journal | IEE Colloquium (Digest) |
Issue number | 103 |
Publication status | Published - 1 Dec 1990 |
Event | Colloquium on Applications of Quantum Wells in Optoelectronics - London, Engl Duration: 13 Jun 1990 → 13 Jun 1990 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering