Perfectly-matched-layer truncation is exponentially accurate at high frequency

J. Galkowski, David Lafontaine, Euan Spence

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	SIAM Journal on Mathematical Analysis
Publication status	Acceptance date - 27 Jan 2023

Access to Document

@article{8bdf9f3cf7d3437199af7f5616fb5c1d,

title = "Perfectly-matched-layer truncation is exponentially accurate at high frequency",

author = "J. Galkowski and David Lafontaine and Euan Spence",

year = "2023",

month = jan,

day = "27",

language = "English",

journal = "SIAM Journal on Mathematical Analysis (SIMA)",

issn = "0036-1410",

publisher = "Society for Industrial and Applied Mathematics Publications",

}