Origin of the drain current bistability in polymer ferroelectric field-effect transistors

R. C.G. Naber, J. Massolt, M. Spijkman, K. Asadi, P. W.M. Blom, D. M. De Leeuw

Research output: Contribution to journalArticlepeer-review

76 Citations (SciVal)

Fingerprint

Dive into the research topics of 'Origin of the drain current bistability in polymer ferroelectric field-effect transistors'. Together they form a unique fingerprint.

Physics & Astronomy